Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique
Baghdad Science Journal
View Archive Info| Field | Value | |
| Title |
Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique
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| Creator |
Journal, Baghdad Science
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| Description |
Doppler broadening of the 511 keV positron annihilation ??? ? was used to estimate the concentration of defects ?? different deformation levels of pure alnminum samples. These samples were compressed at room temperature to 15, 22, 28, 38,40, and 75 % thickness reduction. The two-state ^sitron-trapping model has been employed. 'I he s and w lineshape parameters were measured using high-resolution gamma spectrometer with high pure germanium detector of 2.1 keV resolution at 1.33 MeV of 60Co. The change of defects concentration (Co) with the deformation level (e) is found to obey an empirical formula of the form Cd - A £ B where A and ? are positive constants that depend mainly on the deformation procedure and the temperature at which the deformation takes place.
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| Publisher |
College of Science for Women - University of Baghdad
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| Date |
2004-03-07
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| Type |
info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion Peer-reviewed Article |
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| Format |
application/pdf
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| Identifier |
http://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/516
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| Source |
مجلة بغداد للعلوم; مجلد 1 عدد 1 (2004): issue 1; 149-153
Baghdad Science Journal; Vol 1 No 1 (2004): issue 1; 149-153 2411-7986 2078-8665 |
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| Language |
eng
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| Relation |
http://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/516/447
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| Rights |
Copyright (c) 2004 Baghdad Science Journal
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