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Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique

Baghdad Science Journal

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Title Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique
 
Creator Journal, Baghdad Science
 
Description Doppler broadening of the 511 keV positron annihilation ??? ? was used to estimate the concentration of defects ?? different deformation levels of pure alnminum samples. These samples were compressed at room temperature to 15, 22, 28, 38,40, and 75 % thickness reduction. The two-state ^sitron-trapping model has been employed. 'I he s and w lineshape parameters were measured using high-resolution gamma spectrometer with high pure germanium detector of 2.1 keV resolution at 1.33 MeV of 60Co. The change of defects concentration (Co) with the deformation level (e) is found to obey an empirical formula of the form Cd - A £ B where A and ? are positive constants that depend mainly on the deformation procedure and the temperature at which the deformation takes place.
 
Publisher College of Science for Women - University of Baghdad
 
Date 2004-03-07
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
Peer-reviewed Article
 
Format application/pdf
 
Identifier http://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/516
 
Source مجلة بغداد للعلوم; مجلد 1 عدد 1 (2004): issue 1; 149-153
Baghdad Science Journal; Vol 1 No 1 (2004): issue 1; 149-153
2411-7986
2078-8665
 
Language eng
 
Relation http://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/516/447
 
Rights Copyright (c) 2004 Baghdad Science Journal